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The FUJIFILM FDL 5000 leads the way into a new age of Imaging Plate Electron Micrography


[PICTURE]: View of HNb2O5 Capture high-resolution images of superb clarity.

      25 µm-pixel, high-resolution images deliver clear visualization of your specimen, even when a high-speed shutter is used.

View of HNb2O5 from a Htiachi H-1250.
Accelerating voltage: 1000 kV
Magnification: x 800,000
Electron dose (C/cm2): 4 x 1012.
(Data courtesy of Dr. Naoki Yamamoto, Tokyo Institute of Technology.)


[PICTURE]: View of carbon nanotube Process images quickly and reliably with Image Gauge.

    Image-processing functions such as Image Gauge  -  standard on all FDL 5000 systems  -  deliver clear images quickly and reliably.

View of carbon nanotube from a Phillips EM400.
Accelerating voltage: 120kV
Magnification: x 300,000.
(Data courtesy of Dr. Yahachi Saito, Mie University.)


[PICTURE]: Cross-sectional view of radish leaf Enhance your observation of low-contrast images.

      Wide-angle detection and 3,760 x 3,000 resolution provide superb visualization of low-contrast images.

Cross-sectional view of radish leaf from a Hitachi H-7100.
Accelerating voltage; 100kV
Magnification: x 8,500.
(Data courtesy of Hitachi Ltd., Instruments Division)


[PICTURE]: View of insect compound eye Obtain photographic-grade images without the use of film.

      Using the Fujifilm FDL 5000, you can easily obtain a final, photographic-grade image in minutes without tedious darkroom work.

View of insect compound eye from a Topcon EM002B/Bio-p.
Accelerating voltage: 80kV
magnification: x 50.
(Data courtesy of Topcon Corp.)


[PICTURE]: Diffraction pattern of compound semiconductor Capture high-quality, low-dose images through excellent sensitivity.

      The use of an Imaging Plate maximizes the effect of energy filters.

Diffraction pattern of compound semiconductor from a Zeiss EM912 OMEGA.
Accelerating voltage: 120kV
Zero-loss image.
(Data courtesy of Dr. Daisuke Shindo, Tohoku University; Dr. J.C.H. Spence, Arizona State University; and Dr. Akiko Gomyo, NEC.)


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